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About Patrick Steiner
Patrick Steiner was born in 1983 in Bern, Switzerland. After finishing his BSc degree in electrical engineering, he received his MSc degree in biomedical engineering with major biomedical imaging from the ETH Zürich (Switzerland) in 2010. Since then he has been working as a scientific associate with focus on optical coherence tomography in the optics and photonics laboratory of the Bern University of Applied Science (Switzerland).
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Related Topics
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Influence and compensation of autocorrelation terms in depth-resolved spectroscopic Fourier-domain optical coherence tomography