1. Jakub Czajkowski

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    1. Mentioned In 6 Articles

    2. Optical Coherence Tomography as a Characterization Method in Printed Electronics (Thesis)

      Optical Coherence Tomography as a Characterization Method in Printed Electronics (Thesis)
      This Thesis proposes and describes the use of optical coherence tomography (OCT) as a non-contact and non-destructive characterization technique for printed electronics. It is based on and includes the first published results of such an application of the OCT technique. Several different types of structures were studied to evaluate the feasibility of the application. The measurement data was used to define the surface topography, physical dimensions of the specimen features ...
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    3. Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics.

      Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics.
      We present the use of sub-micron resolution optical coherence tomography (OCT) in quality inspection for printed electronics. The device used in the study is based on a supercontinuum light source, Michelson interferometer and high-speed spectrometer. The spectrometer in the presented spectral-domain optical coherence tomography setup (SD-OCT) is centered at 600 nm and covers a 400 nm wide spectral region ranging from 400 nm to 800 nm. Spectra were acquired at ...
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  2. About Jakub Czajkowski

    Jakub Czajkowski is a researcher at the Optoelectronics and Measurement Techniques Laboratory at the University of Oulu.