Voltage Noise and Jitter Analysis for Swept Source Optical Coherence Tomography using KTa1-xNbxO3 Deflector
This paper describes voltage noise and jitter analysis for the depth deviation of a point spread function in a swept source optical coherence tomography system using a KTa1-xNbxO3 deflector. An interference waveform with voltage noise and jitter was simulated according to a previous report. Typical values for the voltage noise ΔVTYP and jitter ΔtTYPwere also obtained from a previous report and experiment. It was determined that the depth deviation is limited by the ΔtTYP of the system. Therefore, the quality of the tomographic image can be efficiently improved by reducing jitter.