1. Dual-side view optical coherence tomography for thickness measurement on opaque materials

    Dual-side view optical coherence tomography for thickness measurement on opaque materials

    Optical coherence tomography (OCT), as an optical interferometric imaging technique, has found wide applications in various fields. In principle, OCT is well suited for imaging layered structures, and thus, one of the typical applications is thickness measurement. However, due to the limited imaging depth resulting from light attenuation, thickness measurement by OCT is limited to non-opaque materials. In this study, we developed a novel (to the best of our knowledge) dual-side view OCT (DSV-OCT) system for thickness measurement on opaque materials. The dual-side view was achieved on a conventional swept source OCT platform by creating two symmetrical sampling arms. This ...

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