1. Freeform metrology using swept-source optical coherence tomography with custom pupil-relay precision scanning configuration

    Freeform metrology using swept-source optical coherence tomography with custom pupil-relay precision scanning configuration

    The recent advances in the optics manufacturing industry to achieve the capability of fabricating rotationally nonsymmetric optical quality surfaces have considerably stimulated the optical designs with freeform components. This opens up new horizons for novel optical systems with larger fields of view and higher performance, or significantly more compact in volume at equal performance compared to conventional systems. A bottleneck to the broad industrial applications of freeform optics remains the lack of a high performance optical metrology tool capable of measuring significant surface departures and slopes of the parts. To address this issue, we have developed a fiber-based swept-source optical ...

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