1. Method and apparatus for scanning optical delay line

    The present invention relates in general to optical interferometric systems, and in particular to scanning optical delay lines of an interferometric system.Interferometric systems are deployed in a wide and growing number of applications. Typically, interferometric systems involve two arms, a beam splitter and a beam combiner. A beam of light incident the beam splitter is divided in two: one partof the beam is directed down each of the arms. The two parts are then recombined at a beam combiner.
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