1. Nondestructive metrology by optical coherence tomography empowering manufacturing iterations of layered polymeric optical materials

    Nondestructive metrology by optical coherence tomography empowering manufacturing iterations of layered polymeric optical materials

    In recent years, there has been an ever-growing interest in exploring different optical materials and components to develop compact and effective optical systems. The design and fabrication of high-performance optics require nondestructive metrology techniques to inspect the samples. We have investigated the capability of optical coherence tomography (OCT) to nondestructively characterize layered polymeric materials. Using a custom developed Gabor-domain optical coherence microscopy system centered at 800 nm with 120 nm full width at half maximum enabling unprecedented 2 μ m resolution both laterally and axially in an 8     mm 3 volume, we investigated the internal structure of 50 μ m thick films ...

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