1. Nondestructive metrology of layered polymeric optical materials using optical coherence tomography

    Nondestructive metrology of layered polymeric optical materials using optical coherence tomography

    In recent years, there has been an ever-growing interest in exploring novel, highly efficient optical materials to develop compact and effective optical components. The design and fabrication of high-performance optics require nondestructive metrology techniques to inspect the samples. We have investigated the capability of optical coherence tomography (OCT) to nondestructively characterize layered polymeric materials. Using a swept-source OCT system with a wavelength range of 1.25 - 1.41 μm, we achieved micron-scale three-dimensional visualization of the interior structures and details of the layered polymers. The 3D OCT imaging also enabled accurate identification of the locations of defects within the samples ...

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