1. Quantitative Phase Imaging With Swept-Source Optical Coherence Tomography for Optical Measurement of Nanostructures

    Quantitative Phase Imaging With Swept-Source Optical Coherence Tomography for Optical Measurement of Nanostructures

    In this letter, a phase-sensitive, swept-source optical coherence tomography (SS-OCT) system is implemented for the optical measurement of nanostructures. A new approach is proposed to reduce the phase errors, resulting from trigger jitter of the swept source and the asynchronization between the A-scan trigger and OCT signal at the data acquisition end, with a narrowband fiber Bragg grating to generate the accurate A-scan trigger. Furthermore, combining the common-path configuration with the proposed approach, the displacement sensitivity can be calculated to be 80 pm when the swept source is operated at 30 kHz. Finally, the conducting glass was scanned with the ...

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