1. Ultra-high resolution optical coherence tomography for encapsulation quality inspection

    Ultra-high resolution optical coherence tomography for encapsulation quality inspection
    We present the application of ultra-high resolution optical coherence tomography (UHR-OCT) in evaluation of thin, protective films used in printed electronics. Two types of sample were investigated: microscopy glass and organic field effect transistor (OFET) structure. Samples were coated with thin (1–3 μm) layer of parylene C polymer. Measurements were done using experimental UHR-OCT device based on a Kerr-lens mode locked Ti:sapphire femtosecond laser, photonic crystal fibre and modified, free-space Michelson interferometer. Sub-micron resolution offered by the UHR-OCT system applied in the study enables registration of both interfaces of the thin encapsulation layer. Complete, volumetric characterisation of protective ...
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