1. Optical Interference Measurement using High-Coherence Wavelength Swept Light Sources

    Optical Interference Measurement using High-Coherence Wavelength Swept Light Sources

    Conventional contact measurement is replacing product shape inspection by non-contact optical measurement as part of the evolution of “smart factories”. Optical measurement includes various non-contact and non-destructive optical interferometry methods. Conventional methods feature accuracies ranging from nm to µm-order levels, but measurement distances are short, and high measurement accuracy is difficult to achieve due to meter-level measurement distances for targets with large surface areas. Our Wavelength swept light source with high coherence length supports accurate measurement over distances of several meters. This article explains the basic principles of OFDR as a typical optical interferometry measurement method and discusses the results ...

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